Alarm Pattern Analysis Using Computational Intelligence Approach

In today’s high value manufacturing, machines are often equipped with sensors to detect disturbances in
the system, which may trigger the corresponding alarm(s) when limits are exceeded. Apart from displaying on a
terminal for human intervention, these alarm values are also logged to a database. Machine faults or breakdown
may be characterized by a set of alarm patterns. The ability to detect these patterns early can help to alert and
prevent impending machine failure, which is extremely useful for mission critical machines. This project involves
the development of pattern identification concepts and algorithms based on computational intelligence approaches
to predict machine failures. Some of these approaches include Ant Colony System, Genetic Algorithm, and
Statistical methods.
Students with keen interest to learn computational intelligence for pattern recognition and those with knowledge
in manufacture equipment management will have an added advantage for this project